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Business

Corporate Support Services

What Are Corporate Support Services?

We provide analysis services to enhance product quality and identify solutions for product failures using a range of advanced testing and analysis equipment.

Business Guide

Surface analysis

  • Support for improving product technology and securing global competitiveness through the use of advanced surface analysis equipment and technologies at FITI Testing & Research Institute.
  • Technical support for company issues based on analysis technologies for various industrial items, including textiles/polymer materials, plastics, metals, electronics, and electrical components.
  • List of analytical instruments

  • XPS

    • Equipment capable of elemental composition analysis on surfaces or at certain depths of various materials, ranging from general materials such as textiles/polymers, metals, and semiconductors to advanced materials.

  • Integrated infrared spectrometer

    • An equipment capable of qualitative analysis of fine organic samples through infrared, with a microscope function that allows targeting and analyzing specific areas.

  • Simultaneous thermal analysis (TGA/DSC)

    • An equipment capable of performing thermal decomposition of samples while heating in the temperature range of RT to 1600°C, with functions for weight analysis such as weight change and temperature stability, as well as analysis of polymerization, crystallinity, and glass transition.

  • 3D Image Analysis System

    • An optical microscope equipment capable of multi-angle/multi-focus measurements, allowing surface measurements of various materials such as textiles, fibers, and polymer/ceramic composites.
    • Using Correlative Microscopy technology, it enables the linkage of analyses from micro to nanoscale.

  • 3D Surface Analyzer

    • An equipment capable of surface measurement through optical magnification and precise surface roughness analysis using laser technology.
    • Using Correlative Microscopy technology, it enables the linkage of analyses from micro to nanoscale.

  • High-performance 3D X-ray surface analyzer

    • An equipment that allows non-destructive surface and internal measurement up to the microscale using X-ray, and can apply tensile or compression forces via in-situ equipment to measure structural deformation under load.
    • Using Correlative Microscopy technology, it enables the linkage of analyses from micro to nanoscale.

  • 3D fracture analysis cryo-electron microscopy (FIB-SEM)

    • An equipment capable of measuring sample surfaces up to the nanoscale, with Cryo functionality that enables low-temperature environments to minimize damage and measure organic materials.
    • It is possible to perform precise internal analysis by milling the sample using FIB Beam, and Correlative Microscopy technology allows for analysis linkage from micro to nanoscale.

Failure Cause Analysis

  • By identifying the root causes of failures and issues, this process helps to detect malfunction phenomena occurring during manufacturing, storage, and distribution, thereby improving the cause of the failure to prevent product defects and contribute to product quality improvement.
  • Types of Analysis Services
    • Cause analysis of consumer claims.
    • Analysis of the causes of defects that lead to quality issues during the manufacturing process.

Court Appraisal

  • Appraisal refers to the process in legal proceedings where, upon the court's order, an expert (such as a technical engineer) is tasked with making judgments about the authenticity, quantity, and value of specific matters.
    • Defects in the technical field can lead to physical, human, and mental damage. The party responsible for the defect often denies or tries to conceal the issue, while the injured party must prove the damage in order to receive compensation. However, non-expert victims in the field of science and technology find it difficult to identify the cause of the damage and determine responsibility. Even if the victim is an expert, their claims lack persuasive power due to being one-sided.
    • Thus, a third-party statement is essential for both parties involved in technical disputes (the offender and the victim). Based on its professional expertise, FITI Testing & Research Institute provides fair and accurate appraisal services to the parties involved in technical disputes.
    • FITI Testing & Research Institute conducts appraisal work upon request from courts involved in civil defect disputes, appraising the issues designated by the court and reporting the results back to the court. Our professional appraisers are registered in 21 district courts across the country, including five high courts, the Patent Court, and administrative courts.
  • Court Appraisal Services Area
    • Disputes over defects in textile materials, fabrics, and sewn finished products.
    • Disputes over defects in polymer, metal products, and similar items.
    • Disputes over physical property defects in electrical and electronic products, as well as electrical components.