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Business

Surface/Failure Cause Analysis and Court Appraisal

What is Surface/Failure Cause Analysis and Court Appraisal?

Surface/Failure Cause Analysis and Court Appraisal is a comprehensive analysis service that leverages advanced testing and analytical equipment to enhance product quality and resolve causes of product failures. This service is designed to support companies across a wide range of industries by providing systematic solutions for product improvement and defect prevention.

Business Guide

Surface Analysis

  • Surface analysis is a core component of the Corporate Support Service. Utilizing the advanced equipment and expertise of FITI Testing & Research Institute, this service helps companies improve product technology and strengthen global competitiveness. Technical support is provided for a wide range of industrial items, including textiles, polymers, plastics, metals, electronics, and electrical components.
  • List of Analytical Instruments

  • XPS (X-ray Photoelectron Spectroscopy)

    • XPS enables elemental composition analysis on surfaces or at specific depths for various materials, ranging from general materials such as textiles, polymers, metals, and semiconductors to advanced materials.

  • Integrated Infrared Spectrometer

    • This instrument provides qualitative analysis of fine organic samples using infrared radiation. Equipped with a microscope function, it allows targeted analysis of specific areas.

  • Simultaneous Thermal Analyzer (TGA/DSC)

    • The simultaneous thermal analyzer performs thermal decomposition of samples while heating within a temperature range from room temperature to 1600°C. It provides functions for weight analysis (such as weight change and temperature stability), as well as for analyzing polymerization, crystallinity, and glass transition.

  • 3D Image Analysis System

    • This optical microscope allows multi-angle and multi-focus measurements, enabling surface analysis of various materials such as textiles, fibers, and polymer/ceramic composites. Utilizing Correlative Microscopy technology, it enables linked analyses from micro to nanoscale.

  • 3D Surface Analyzer

    • This instrument enables surface measurement through optical magnification and precise surface roughness analysis using laser technology. Correlative Microscopy technology allows linked analyses from micro to nanoscale.

  • High-Performance 3D X-ray Surface Analyzer

    • This analyzer allows non-destructive surface and internal measurements up to the microscale using X-rays. With in-situ equipment, it can apply tensile or compressive forces to measure structural deformation under load. Correlative Microscopy technology enables linked analyses from micro to nanoscale.

  • 3D Fracture Analysis Cryo-Electron Microscope (FIB-SEM)

    • This instrument measures sample surfaces up to the nanoscale. The Cryo function enables low-temperature environments to minimize damage and facilitate measurement of organic materials. Precise internal analysis is possible by milling samples with an FIB beam, and Correlative Microscopy technology enables linked analyses from micro to nanoscale.

Failure Cause Analysis

  • Failure cause analysis is an integral part of the Corporate Support Service. By identifying the root causes of failures and issues, this process helps detect malfunctions that occur during manufacturing, storage, and distribution. Improving the causes of failures helps prevent product defects and contributes to product quality improvement.
  • Types of Analysis
    • Cause analysis of consumer claims
    • Analysis of the causes of defects leading to quality issues during the manufacturing process
  • Analysis Service Fields
    • Analysis is provided for defects occurring in a wide range of industrial items, including apparel and industrial textiles, polymers, plastics, metals, and electronic materials.

Court Appraisal

  • Court appraisal is a specialized component of the Corporate Support Service. In legal proceedings, upon the court’s order, an expert (such as a technical engineer) is tasked with making judgments about the authenticity, quantity, and value of specific matters.
    • Defects in the technical field can lead to physical, human, and mental damages. The party responsible for the defect often denies or conceals the issue, while the injured party must prove the damage to receive compensation. However, victims who are not experts in science and technology find it difficult to identify the cause and responsibility of the damage. Even if the victim is an expert, their claims lack persuasive power due to being one-sided.
    • Third-party testimony is essential for both parties involved in technical disputes. Based on its professional expertise, FITI Testing & Research Institute provides fair and accurate appraisal services to the parties involved in technical disputes.
    • FITI Testing & Research Institute conducts appraisal work upon request from courts involved in civil defect disputes. Appraisers evaluate the issues designated by the court and report the results back to the court. Our professional appraisers are registered in 21 district courts nationwide, including five high courts, the Patent Court, and administrative courts.
  • Court Appraisal Service Fields
    • Disputes over defects in textile materials, fabrics, and sewn finished products
    • Disputes over defects in polymer and metal products
    • Disputes over physical property defects in electrical and electronic products, as well as electrical components